Multiple Use Microscopy Calibration and AFM Profilometry MRS-3

Multiple Use Microscopy Calibration and AFM Profilometry MRS-3The 10 x 50,000x Pitch Standard for Scanning Electron Microscopy Details of Traceability to NIST, NPL or ISO 9000 Compliance Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies and Profilometry STM, AFM, the pattern height is 100nm Optical Microscopy transmitted, reflected, bright dark field, differential contrast and confocal Chemical mapping EDS, WDS, XRF, XPS, Auger and others.

self-cleaning

Speed Range 10 to 2

Two types of specimen mounts for the widely used DEBEN Coolstage for Low Vacuum and Natural SEMs from JEOL

Gauge sets the sample for an 0

peel-and-stick labels cannot be removed in one piece

With advanced coil technology the strength of the coupling between the unit and stir bar is controlled by the amount of electric current that flows through the coil

define the tip of the notch the 0

There are two holes in the lid so that the temperature probe can be inserted on either side to monitor heating rates

2 flow-limiting Plugs and Bulbs plus Instructions

The antifadent solutions AF-1

Holder size is Ø42 x 10

Resistant to chemical solvents