Silicon Nitride AFM Probes

Silicon Nitride AFM ProbesSilicon nitride XNC12 triangular AFM cantilevers Typical radius of uncoated AFM tip 10nm Resulting AFM tip radius with the coating 30nm Full AFM tip cone angle 70 Total AFM tip height 3. 5nm AFM Probe material Silicon nitride AFM Tip coating None or Gold Detector coating Gold The XNC12 series AFM probes have 2 different triangular silicon nitride AFM cantilevers on one side of the holder chip. The AFM cantilevers are thin and soft. Each AFM cantilever

Polycrystalline diamond is somewhat spherical in shape and it has a greater number of cutting facets than monocrystalline diamond

and aggregates (NOAA) in native state

and glass knives

53740 - Heavy Duty

Specifications Housing Material: Polycarbonate material allows clear desiccant visibility

Delivers great performance with a shear strength of 200 psi

allowing users to easily push up and access the SmartStor boxes

Use PELCO® Plast Support Putty (shown below) between metal slide and back of the sample

90º corner or beveled edges

5 x 7cm (4

7 110mm NM-SS 0

Please note that the blade holder and cutting table are modified to accommodate Ø60 x 13