SKU:50424125656

Hamamatsu C1515-02 Wafer Surface Inspection System

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Regular price $427.50 USD
Regular price $466.50 USD Sale price $427.50 USD
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USA
  • USA
  • CAN

Ships within 48 hours · Estimated delivery Aug 7 - Aug 12

Description

Hamamatsu C1515-02 Wafer Surface Inspection SystemCondition Used Seller Notes In working conditions. Brand Hamamatsu Microscope Structure Upright Microscope Type Wafer Surface Inspection Model C1515 02 MPN C1515 02 Product Description Product appearance: 80% 99% New Functional test: Normal We have 3 units of Hamamatsu C1515 02 Wafer Surface Inspection System. Pictures shown are for reference; we ship randomly. Please contact us for real product images. Due to the second hand nature of the product,

We have 6 units of 1PC NEW REXROTH DBW20A2-53/200-6EG24N9K4/12 VALVE #QA227 ZX

good working” Brand Tektronix MPN P6114B UPC Does Not Apply ♥ Product Description

We have 8 units of 1pc NEW MD200S0

” Brand Baxter Model DX-31 MPN DX-31 Furnace/Oven Type Drying Oven ♥ Product Description

Place of Origin Malaysia Warranty 3 years Customized support OEM Brand Name Keysight Model Number M9602A ♥ Product Description

Condition New Brand Omron MPN Does Not Apply Country/Region of Manufacture Japan Model D4E-1D10N Controller Platform Automate UPC Does not apply ♥ Product Description

We have 7 units of 1PC Pulsotronic Proximity Switch Sensor KJ4-M18MB80-ANU-X0409 9914-0902

” Country/Region of Manufacture United States MPN E119972 Rev

We have 4 units of 1pc USED MML03-HR65-5m telecentric lens TESTED #V0MG CH

35 Interface Universal Inline Probe ASE V35

Place of Origin other Warranty 1 months Model Number Fluke PM6685 Price need to consult Condititon Tested good Product appearance contact us for real pics Warraty contact us Selling Units: Single item Single package size: 20X15X12 cm Single gross weight: 2

5 regulating valve controller #N198F YF

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Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
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