MAG*I*CAL

MAG*I*CALTraceable Transmission Electron Microscopy Calibration Standard Kikuchi pattern of single crystal silicon viewed down the <011> zone axis. The broad band in the center of this figure is between the [200] Kikuchi lines. This standard is directly traceable to the crystal lattice constant of silicon and performs all major instrument calibrations for Transmission Electron Microscopy: All TEM magnification ranges Camera constant Image diffraction pattern

Thin Specimen Split Mount

Keeps benchtops clean and safe from stains

The CS-20NG is suitable for both lateral and vertical AFM scanner calibration

Nature Nanotechnology

they are truly unique

The standard desiccator comes with a clear acrylic plastic lid suitable for samples up to 12mm tall

short and long pin with M4 threads to convert any of the Modular SEM Specimen Holders into a pin stub type holder

3mm 420µm Individual Well 12 #36171 19

A unique feature with this system is to be able to read bar codes without having to remove the slides from the box

The C-clip Bottoming Tool provides an easier and more efficient way to "bottom" the C-clip at the tip of the barrel of a clipping tool prior to clipping

After dicing or scribing acetone or MEK may be used to separate the specimen from the Wafer-Mount™ 559

141-3 (20 compartments) and 141-4 (20 compartments)