SKU:69828913810
KPFM-EFM Standard
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USA
- USA
- CAN
- USA
- CAN
Ships within 48 hours · Estimated delivery Jul 30 - Aug 4
Description
KPFM-EFM StandardClose up of KPFM EFM Probe Standard A test and calibration standard for Electrostatic Force and Kelvin Probe atomic force microscopy modes. Sample consists of arrays of Aluminum and Gold lines deposited on oxide covered silicon. Thin copper wires are connedted to the Al and Au contact pads, allowing a specified electric field to be applied between the lines. Line arrays with 8, 20, and 40um pitch Line height of ~35nm Mounted verson is on 15mm glass on
Flush with hot soapy water then rinse thoroughly
The PELCO® FIB Lift-Out TEM Grids have been designed for in-situ lift to attach the TEM lamellas milled out by SEM/FIB or FIB systems
Designed for continuous temperature uniformity
The PELCO Prep-Eze™ fits with the #36135 Polypropylene Petri Dishes
1mm + Crossline + Square
ZEISS/TESCAN
transporting and shipping samples and calibration standards
NIST traceable* with features from 2mm to 50nm for magnification 10x-200
To avoid contamination of test and calibration samples
Stainless Steel (18-8) - as a non-corrosive and cleaner alternative for environmental SEM's and FESEM
LaB6 Surface Recession vs Temperature (47KB PDF) Graph
used specimen dishes can be discarded and replaced (specimen dish refills available)
Easy Shipping
Quick Dispatch:
Your KPFM-EFM Standard orders ship within 1-2 business days.
Delivery Options:
- Standard: 3-7 business days
- Fast: 2-3 business days
- Express: 1-2 business days
Order Tracking:
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Exchange/Return Notes
- We offer a 30-day return/exchange service after receiving.
- Final sale items are not eligible for returns or exchanges.
- To process your return/exchange, please contact us at [email protected]
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