SKU:84453182472
Contact Mode AFM Probe
Free Shipping on orders over $50
Shipping Estimate
USA
- USA
- CAN
- USA
- CAN
Ships within 48 hours · Estimated delivery Aug 8 - Aug 13
Description
Contact Mode AFM ProbeContact G Contact Mode AFM Probe AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 m (15 19 m)* Setback: 15 m (10 20 m)* Radius: < 10 nm Half Cone Angle: 20 25 along cantilever axis, 25 30 from side, 10 at the apex AFM Cantilever Cantilever A Shape: Beam Force Constant: 0. 2 N m (0. 07 0. 4 N m)* Resonance Frequency: 13 kHz (9 17 kHz)* Length: 450 m (440 460 m)* Width: 50 m (45 55 m)* Thickness: 2 m (1 3 m)* * typical range Coating Uncoated
• Width: 22mm (0
25mm ✓ ✓ Graticule lines perpendicular to X and Y axes ruled at 10um
sealed documents or small containers
nickel/copper backscattered
For tall specimens on 12
The mount stand by itself is compatible with all types/sizes of M4 mounts
long lasting
Almandine Fe32+Al2(SiO4)3 155
manipulating
the low profile MagFuge® is easy to clean and maintenance free
cleaning pad on one end with a retractable dust removal brush on the other end
Withstands temperatures from 40° to 170°F (4° to 77°C)
Quick Dispatch:
Your Contact Mode AFM Probe orders ship within 1-2 business days.
Delivery Options:
- Standard: 3-7 business days
- Fast: 2-3 business days
- Express: 1-2 business days
Order Tracking:
You'll receive a tracking link by email once your Contact Mode AFM Probe ships.
Need Help?
Questions about Contact Mode AFM Probe, sizing, or delivery? We're just an email away.
Live Shipping Estimates:
Enter your location at checkout to see available shipping methods and costs for Contact Mode AFM Probe in your area.
Get Shipping Estimates
Exchange/Return Notes
- We offer a 30-day return/exchange service after receiving.
- Final sale items are not eligible for returns or exchanges.
- To process your return/exchange, please contact us at [email protected]
- Please click here for more details>>> Return & Exchange Policy