Multiple Use Microscopy Calibration and AFM Profilometry MRS-4

Multiple Use Microscopy Calibration and AFM Profilometry MRS-4SEM Magnification Standard and Stage Micrometer MRS 4 The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies and Profilometry STM, AFM, the pattern height is 70nm Optical Microscopy transmitted, reflected, bright dark field, differential contrast and confocal

An optical micrograph of the colors of silicon when it is thinned down to TEM thicknesses

Silicon monoxide produces a highly resilient support film which can withstand vigorous specimen preparation techniques

and a mini-hotplate (used to remove stubborn wrinkles from tissue sections) which is set to 65°C ±3°C

Horizontal Scale 20mm/0

Hole Width 58µm

Non-magnetic stainless steel

Using the SEM X and Y stage movements and read-outs

such as PS300HS MKII or PS300XO

these specimens are made using a substrate sandwich technique

and endogenous biotin

Supplied with a spare set of running jaws

sharp edge blade with a cutting tip angle of 22° for use in vibratory slicers such as Microslicer™