SKU:54231065320
PA Series
Free Shipping on orders over $50
Shipping Estimate
USA
- USA
- CAN
- USA
- CAN
Ships within 48 hours · Estimated delivery Jul 22 - Jul 27
Description
PA SeriesPA01 AFM tip evaluation sample with sharp pyramidal structures AFM image of the PA01 surface. Scan taken with OPUS 240AC NA probe with tip. Scan size 1m, scan height 95nm. The exact shape of the AFM probe tip is very important for obtaining AFM images of high quality and accuracy. As new AFM tips with nanometer radii of curvature become widespread, periodic structures that have surface features of similar or greater sharpness should be used to
The 22° / 25° tilt provides better detection and higher signal to noise ratio for x-ray analysis
Dimensions Ø32 x 10mm (1-1/4" x 0
AFM Probe Specifications
They have a thickness of 0
a hydrophobic barrier pen
70° pre-tilt EBSD holder has a removable pin to allow M4 mounting
2cm L 13551 Probe
Digital Micrometer for volume selection with volume lock
Medium (12961)
Supplied with nine probes and Buna-N cups (specified below)
The overall platinum coating is electrically conductive and chemically inert
reducing friction
Quick Dispatch:
Your PA Series orders ship within 1-2 business days.
Delivery Options:
- Standard: 3-7 business days
- Fast: 2-3 business days
- Express: 1-2 business days
Order Tracking:
You'll receive a tracking link by email once your PA Series ships.
Need Help?
Questions about PA Series, sizing, or delivery? We're just an email away.
Live Shipping Estimates:
Enter your location at checkout to see available shipping methods and costs for PA Series in your area.
Get Shipping Estimates
Exchange/Return Notes
- We offer a 30-day return/exchange service after receiving.
- Final sale items are not eligible for returns or exchanges.
- To process your return/exchange, please contact us at [email protected]
- Please click here for more details>>> Return & Exchange Policy