KPFM-EFM Standard

KPFM-EFM StandardClose up of KPFM EFM Probe Standard A test and calibration standard for Electrostatic Force and Kelvin Probe atomic force microscopy modes. Sample consists of arrays of Aluminum and Gold lines deposited on oxide covered silicon. Thin copper wires are connedted to the Al and Au contact pads, allowing a specified electric field to be applied between the lines. Line arrays with 8, 20, and 40um pitch Line height of ~35nm Mounted verson is on 15mm glass on

Flush with hot soapy water then rinse thoroughly

The PELCO® FIB Lift-Out TEM Grids have been designed for in-situ lift to attach the TEM lamellas milled out by SEM/FIB or FIB systems

Designed for continuous temperature uniformity

The PELCO Prep-Eze™ fits with the #36135 Polypropylene Petri Dishes

1mm + Crossline + Square

ZEISS/TESCAN

transporting and shipping samples and calibration standards

NIST traceable* with features from 2mm to 50nm for magnification 10x-200

To avoid contamination of test and calibration samples

Stainless Steel (18-8) - as a non-corrosive and cleaner alternative for environmental SEM's and FESEM

LaB6 Surface Recession vs Temperature (47KB PDF) Graph

used specimen dishes can be discarded and replaced (specimen dish refills available)